Mapping of spot blotch disease resistance using NDVI as a substitute to visual observation in wheat (Triticum aestivum L.)

Molecular Breeding

Volumn 36, Issue 7, 2016, Pages

  Kumar, Suneel ^a   Röder, Marion S ^b   Singh, Ravi P ^c   Kumar, Sundeep ^d   Chand, Ramesh ^e   Joshi, Arun K ^e,f   Kumar, Uttam ^c,g  

^a TERI UNIVERSITY   (India)

^b LEIBNIZ INSTITUTE OF PLANT GENETICS AND CROP PLANT RESEARCH IPK   (Germany)

^c INTERNATIONAL MAIZE AND WHEAT IMPROVEMENT CENTER CIMMYT   (Mexico)

^d NATIONAL BUREAU OF PLANT GENETIC RESOURCES   (India)

^e BANARAS HINDU UNIVERSITY   (India)

^f NASC Complex   (India)

^g Borlaug Institute for South Asia (BISA)   (India)

Author keywords

Bipolaris sorokiniana; NDVI; QTL mapping; Spot blotch; Wheat

Indexed keywords

MAPPING; PLANTS (BOTANY); THROUGHPUT;

BIPOLARIS SOROKINIANA; DISEASE RESISTANCE; DISEASE SEVERITY; HIGH-THROUGHPUT PHENOTYPING; NDVI; QTL MAPPING; SPOT BLOTCH; VISUAL OBSERVATIONS; WHEAT; WHEAT (TRITICUM AESTIVUM L.);

GENES;

EID: 84977117649     PISSN: 13803743     EISSN: 15729788     Source Type: Journal    
DOI: 10.1007/s11032-016-0515-6     Document Type: Article

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