Scanning Transmission Electron Microscopy: Z Contrast

Handbook of Microscopy Set: Applications in Materials Science, Solid-State Physics and Chemistry

Volumn 2, Issue , 2008, Pages 595-620

  Pennycook, Stephen J ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Axial detector; Electron energy loss spectroscopy; Scanning transmission electron microscopy; Scattered electrons; Semiconductors

Indexed keywords

ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; ELECTRONS; ENERGY DISSIPATION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS;

AXIAL DETECTORS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SCATTERED ELECTRONS; Z CONTRASTS;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 84976561212     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9783527619283.ch3b     Document Type: Chapter

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