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Volumn 1, Issue , 2008, Pages 425-445

Electron Energy-Loss Spectroscopy Imaging

Author keywords

Energy primary beams; Geometry; Millielectronvolt; Monochromatic; Spectroscopy imaging

Indexed keywords

ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ENERGY DISSIPATION; GEOMETRY;

EID: 84976541049     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9783527619283.ch16a     Document Type: Chapter
Times cited : (3)

References (63)
  • 22
    • 0022734165 scopus 로고
    • S. Lanio, Optik 1986, 73, 99.
    • (1986) Optik , vol.73 , pp. 99
    • Lanio, S.1
  • 23
    • 0002916333 scopus 로고
    • Ed. R. H. Geiss, San Francisco Press, San Francisco, CA
    • H. Shuman, A. P. Somlyo, in Analytical Electron Microscopy (Ed. R. H. Geiss), San Francisco Press, San Francisco, CA 1981, 202.
    • (1981) Analytical Electron Microscopy , pp. 202
    • Shuman, H.1    Somlyo, A.P.2
  • 62
    • 84976575370 scopus 로고
    • private communication
    • N. Brun, 1995, private communication.
    • (1995)
    • Brun, N.1
  • 63
    • 2442678657 scopus 로고
    • P. Batson, Nature 1993, 366, 727.
    • (1993) Nature , vol.366 , pp. 727
    • Batson, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.