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Volumn 105, Issue 4, 2011, Pages 625-631

Evaluating banana ripening status from measuring dielectric properties

Author keywords

Banana; Dielectric constant; Electrical properties; Non destructive; Ripeness

Indexed keywords

CAPACITORS; DIELECTRIC PROPERTIES; ELECTRIC POWER SYSTEMS; FORECASTING;

EID: 84975842692     PISSN: 02608774     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jfoodeng.2011.03.032     Document Type: Article
Times cited : (100)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.