-
1
-
-
0018505572
-
Time dependent error detection rate model for software reliability and other performance measures
-
A. L. Goel and K. Okumoto, Time dependent error detection rate model for software reliability and other performance measures, IEEE Trans. Reliab. R-28(3) (1979) 206-211.
-
(1979)
IEEE Trans. Reliab.
, vol.28
, Issue.3
, pp. 206-211
-
-
Goel, A.L.1
Okumoto, K.2
-
2
-
-
0036733276
-
Analysis of incorporating logistic testing-effort function into software reliability modeling
-
C. Y. Huang and S. Y. Kuo, Analysis of incorporating logistic testing-effort function into software reliability modeling, IEEE Trans. Reliab. 51(3) (2002) 261-270.
-
(2002)
IEEE Trans. Reliab
, vol.51
, Issue.3
, pp. 261-270
-
-
Huang, C.Y.1
Kuo, S.Y.2
-
4
-
-
0003960126
-
-
McGraw Hill
-
J. D. Musa, A. Iannino and K. Okumoto, Software Reliability: Measurement, Prediction, Applications (McGraw Hill, 1987), pp. 267-276.
-
(1987)
Software Reliability Measurement, Prediction, Applications
, pp. 267-276
-
-
Musa, J.D.1
Iannino, A.2
Okumoto, K.3
-
5
-
-
0021468304
-
Software reliability analysis models
-
M. Obha, Software reliability analysis models, IBM J. Res. Dev. 28(4) (1984) 428-443.
-
(1984)
IBM J. Res. Dev
, vol.28
, Issue.4
, pp. 428-443
-
-
Obha, M.1
-
8
-
-
0016777122
-
Analysis of error process in computer software
-
N. F. Schneidewind, Analysis of error process in computer software, Sigplan Notices 10(6) (1975) 337-346.
-
(1975)
Sigplan Notices
, vol.10
, Issue.6
, pp. 337-346
-
-
Schneidewind, N.F.1
-
9
-
-
84555203152
-
Simultaneous allocation of testing time and resources for a modular software
-
P. K. Kapur, A. G. Aggarwal and G. Kaur, Simultaneous allocation of testing time and resources for a modular software, Int. J. Syst. Assurance Eng. Manage. 1(4) (2010) 351-361.
-
(2010)
Int. J. Syst. Assurance Eng. Manage
, vol.1
, Issue.4
, pp. 351-361
-
-
Kapur, P.K.1
Aggarwal, A.G.2
Kaur, G.3
-
10
-
-
84865789278
-
Two dimensional multi-release software reliability modeling and optimal release planning
-
P. K. Kapur, H. Pham, A. G. Aggarwal and G. Kaur, Two dimensional multi-release software reliability modeling and optimal release planning, IEEE Trans. Reliab. 61(3) (2012), pp. 758-768.
-
(2012)
IEEE Trans. Reliab
, vol.61
, Issue.3
, pp. 758-768
-
-
Kapur, P.K.1
Pham, H.2
Aggarwal, A.G.3
Kaur, G.4
-
11
-
-
84893329555
-
Generalized framework for fault detection and correction processes for successive release of software
-
Narosa ICQRIT
-
P. K. Kapur, A. H. S. Garmabaki and A. G. Aggarwal, Generalized framework for fault detection and correction processes for successive release of software, Proc. Int. Conf. Quality, Reliability and Infocom Technology (ICQRIT), pp. 252-263, Narosa, 2012.
-
(2012)
Proc. Int. Conf. Quality Reliability and Infocom Technology
, pp. 252-263
-
-
Kapur, P.K.1
Garmabaki, A.H.S.2
Aggarwal, A.G.3
-
12
-
-
84856523825
-
Multi up-gradation software reliability model with imperfect debugging
-
New Delhi, ICPQROM
-
P. K. Kapur, A. H. S. Garmabaki and J. Singh, Multi up-gradation software reliability model with imperfect debugging, Int. Congr. Productivity, Quality, Reliability, Optimization and Modeling, New Delhi, ICPQROM, 2011.
-
(2011)
Int. Congr. Productivity, Quality, Reliability, Optimization and Modeling
-
-
Kapur, P.K.1
Garmabaki, A.H.S.2
Singh, J.3
-
13
-
-
84555218809
-
Multi up-gradation software reliability growth model with imperfect debugging
-
P. K. Kapur, A. H. S. Garmabaki, J. Singh and O. Singh, Multi up-gradation software reliability growth model with imperfect debugging, Int. J. Syst. Assurance Eng. Manage. 1(4) 299-306.
-
Int. J. Syst. Assurance Eng. Manage
, vol.1
, Issue.4
, pp. 299-306
-
-
Kapur, P.K.1
Garmabaki, A.H.S.2
Singh, J.3
Singh, O.4
-
14
-
-
79959639860
-
Multi up-gradation software reliability model
-
ICRESH-2010
-
P. K. Kapur, A. Tandon and G. Kaur, Multi up-gradation software reliability model, 2nd Int. Conf. Reliability, Safety and Hazard (ICRESH-2010), pp. 468-474.
-
2nd Int. Conf. Reliability, Safety and Hazard
, pp. 468-474
-
-
Kapur, P.K.1
Tandon, A.2
Kaur, G.3
-
15
-
-
84878705610
-
Optimal allocation of testing effort during testing and debugging phases: A control theoretic approach
-
P. K. Kapur, H. Pham, U. Chanda and V. Kumar, Optimal allocation of testing effort during testing and debugging phases: A control theoretic approach, Int. J. Syst. Sci. 44(9) (2013) 1639-1650.
-
(2013)
Int. J. Syst. Sci
, vol.44
, Issue.9
, pp. 1639-1650
-
-
Kapur, P.K.1
Pham, H.2
Chanda, U.3
Kumar, V.4
-
16
-
-
84923082000
-
Testing resource allocation for fault detection and correction processes under dynamic environment
-
INDIACOM-2011, New Delhi
-
P. K. Kapur and V. Kumar, Testing resource allocation for fault detection and correction processes under dynamic environment, Proc. National Conf. Computing for Nation Development (INDIACOM-2011, New Delhi) (2011), pp. 331-336.
-
(2011)
Proc. National Conf. Computing for Nation Development
, pp. 331-336
-
-
Kapur, P.K.1
Kumar, V.2
-
17
-
-
84923084236
-
Dynamic allocation of testing effort when testing and debugging are done concurrently, communication in dependability and quality management
-
P. K. Kapur, U. Chanda and V. Kumar, Dynamic allocation of testing effort when testing and debugging are done concurrently, communication in dependability and quality management, Int. J. Serbia 13(3) (2010) 14-28.
-
(2010)
Int. J. Serbia
, vol.13
, Issue.3
, pp. 14-28
-
-
Kapur, P.K.1
Chanda, U.2
Kumar, V.3
-
18
-
-
77949493305
-
Two-dimensional software reliability measurement technologies
-
S. Inoue and S. Yamada, Two-dimensional software reliability measurement technologies, Proc. IEEE, IEEM, 2009.
-
(2009)
Proc IEEE, IEEM
-
-
Inoue, S.1
Yamada, S.2
-
20
-
-
79952296810
-
Two-dimensional change-point modeling for software reliability assessment
-
S. Inoue, K. Fukuma and S. Yamada, Two-dimensional change-point modeling for software reliability assessment, Int. J. Reliab. 17(6) (2010) 531-542.
-
(2010)
Int. J. Reliab
, vol.17
, Issue.6
, pp. 531-542
-
-
Inoue, S.1
Fukuma, K.2
Yamada, S.3
-
21
-
-
0022705483
-
Software reliability growth models with testing effort
-
S. Yamada, H. Ohtera and H. Narihisa, Software reliability growth models with testing effort, IEEE Trans. Reliab. 35(1) (1986) 19-23.
-
(1986)
IEEE Trans. Reliab
, vol.35
, Issue.1
, pp. 19-23
-
-
Yamada, S.1
Ohtera, H.2
Narihisa, H.3
-
22
-
-
0027559945
-
Software-reliability growth with a Weibull test-effort
-
S. Yamada, J. Hishitani and S. Osaki, Software-reliability growth with a Weibull test-effort, IEEE Trans. Reliab. 42(1) (1993) 100-106.
-
(1993)
IEEE Trans. Reliab
, vol.42
, Issue.1
, pp. 100-106
-
-
Yamada, S.1
Hishitani, J.2
Osaki, S.3
-
23
-
-
0021006179
-
S-shaped software reliability growth modeling for software error detection
-
S. Yamada, M. Ohba and S. Osaki, S-shaped software reliability growth modeling for software error detection, IEEE Trans. Reliab. 32(5) (1983) 475-484.
-
(1983)
IEEE Trans. Reliab
, vol.32
, Issue.5
, pp. 475-484
-
-
Yamada, S.1
Ohba, M.2
Osaki, S.3
-
26
-
-
0030286540
-
Predicting software reliability
-
A. Wood, Predicting software reliability, IEEE Comput. 29(11) (1996) 69-77.
-
(1996)
IEEE Comput
, vol.29
, Issue.11
, pp. 69-77
-
-
Wood, A.1
|