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Volumn 8, Issue 5, 1991, Pages 778-790

Modeling optical microscope images of integrated-circuit structures

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EID: 84975664160     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.8.000778     Document Type: Article
Times cited : (41)

References (17)
  • 1
    • 0001101134 scopus 로고
    • Diffraction of a plane wave at a sinusoidally stratified dielectric grading
    • C. B. Burckhardt, “Diffraction of a plane wave at a sinusoidally stratified dielectric grading,” J. Opt. Soc. Am. 56, 1502-1509 (1966).
    • (1966) J. Opt. Soc. Am. , vol.56 , pp. 1502-1509
    • Burckhardt, C.B.1
  • 2
    • 0002650865 scopus 로고
    • Diffraction by thick, periodically stratified gratings with complex dielectric constant
    • F. G. Kaspar, “Diffraction by thick, periodically stratified gratings with complex dielectric constant,” J. Opt. Soc. Am. 63,3745 (1973).
    • (1973) J. Opt. Soc. Am. , vol.63 , pp. 3745
    • Kaspar, F.G.1
  • 3
    • 0020191966 scopus 로고
    • Theory of optical edge detection and imaging of thick layers
    • D. Nyyssonen, “Theory of optical edge detection and imaging of thick layers,” J. Opt. Soc. Am. 72,1425-1436 (1982).
    • (1982) J. Opt. Soc. Am. , vol.72 , pp. 1425-1436
    • Nyyssonen, D.1
  • 5
    • 0009852064 scopus 로고
    • Optical microscope imaging of lines patterned in thick layers with variable edge geometry: Theory
    • D. Nyyssonen and C. P. Kirk, “Optical microscope imaging of lines patterned in thick layers with variable edge geometry: theory,” J. Opt. Soc. Am. A 5,1270-1280 (1988).
    • (1988) J. Opt. Soc. Am. A , vol.5 , pp. 1270-1280
    • Nyyssonen, D.1    Kirk, C.P.2
  • 7
    • 0025595451 scopus 로고
    • Modeling of optical alignment and metrology schemes used in IC manufacturing
    • Proc. Soc. Photo-Opt. Instrum. Eng
    • C. Yuan and A. J. Strojwas, “Modeling of optical alignment and metrology schemes used in IC manufacturing,” in Optical/La- ser Microlithography III, V. Pol, ed., Proc. Soc. Photo-Opt. Instrum. Eng. 1264, 203-218 (1990).
    • (1990) Optical/La- Ser Microlithography III, V. Pol , vol.1264 , pp. 203-218
    • Yuan, C.1    Strojwas, A.J.2
  • 9
    • 0001869632 scopus 로고
    • Rigorous vector theory of diffraction gratings
    • E. Wolf, edNorth-Holland, Amsterdam
    • D. Maystre, “Rigorous vector theory of diffraction gratings,” in Progress in Optics, E. Wolf, ed. (North-Holland, Amsterdam, 1984), Vol. 21, p. 15.
    • (1984) Progress in Optics , vol.21 , pp. 15
    • Maystre, D.1
  • 10
    • 0037842469 scopus 로고
    • Addison-Wesley, Reading, Mass
    • E. Hecht and A. Zajac, Optics (Addison-Wesley, Reading, Mass., 1974), pp. 465-467.
    • (1974) Optics , pp. 465-467
    • Hecht, E.1    Zajac, A.2
  • 13
    • 84941872265 scopus 로고
    • Phase detection using scanning optical microscopy
    • K. M. Monahan, ed., Proc. Soc. Photo-Opt. Instrum. Eng
    • J. P. H. Benschop, “Phase detection using scanning optical microscopy,” in Integrated Circuit Metrology, Inspection, and Process Control, K. M. Monahan, ed., Proc. Soc. Photo-Opt. Instrum. Eng. 921,123-130 (1988).
    • (1988) Integrated Circuit Metrology, Inspection, and Process Control , vol.921 , pp. 123-130
    • Benschop, J.P.H.1
  • 14
    • 0018433491 scopus 로고
    • Quantitative surface topography determination by Nomarski reflection microscopy. I. Theory
    • D. L. Lessor, J. S. Hartman, and R. L. Gordon, “Quantitative surface topography determination by Nomarski reflection microscopy. I. Theory,” J. Opt. Soc. Am. 69,357-366 (1979).
    • (1979) J. Opt. Soc. Am. , vol.69 , pp. 357-366
    • Lessor, D.L.1    Hartman, J.S.2    Gordon, R.L.3
  • 15
    • 0343942232 scopus 로고
    • Surface roughness evaluation by image analysis in Nomarski DIC microscopy
    • B. Truax, ed., Proc. Soc. Photo-Opt. Instrum. Eng
    • M. J. Fairlie, J. G. Akkerman, R. S. Timsit, and J. M. Zavislan, “Surface roughness evaluation by image analysis in Nomarski DIC microscopy,” in Metrology: Figure and Finish, B. Truax, ed., Proc. Soc. Photo-Opt. Instrum. Eng. 749,105-113 (1987).
    • (1987) Metrology: Figure and Finish , vol.749 , pp. 105-113
    • Fairlie, M.J.1    Akkerman, J.G.2    Timsit, R.S.3    Zavislan, J.M.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.