-
1
-
-
0001101134
-
Diffraction of a plane wave at a sinusoidally stratified dielectric grading
-
C. B. Burckhardt, “Diffraction of a plane wave at a sinusoidally stratified dielectric grading,” J. Opt. Soc. Am. 56, 1502-1509 (1966).
-
(1966)
J. Opt. Soc. Am.
, vol.56
, pp. 1502-1509
-
-
Burckhardt, C.B.1
-
2
-
-
0002650865
-
Diffraction by thick, periodically stratified gratings with complex dielectric constant
-
F. G. Kaspar, “Diffraction by thick, periodically stratified gratings with complex dielectric constant,” J. Opt. Soc. Am. 63,3745 (1973).
-
(1973)
J. Opt. Soc. Am.
, vol.63
, pp. 3745
-
-
Kaspar, F.G.1
-
3
-
-
0020191966
-
Theory of optical edge detection and imaging of thick layers
-
D. Nyyssonen, “Theory of optical edge detection and imaging of thick layers,” J. Opt. Soc. Am. 72,1425-1436 (1982).
-
(1982)
J. Opt. Soc. Am.
, vol.72
, pp. 1425-1436
-
-
Nyyssonen, D.1
-
5
-
-
0009852064
-
Optical microscope imaging of lines patterned in thick layers with variable edge geometry: Theory
-
D. Nyyssonen and C. P. Kirk, “Optical microscope imaging of lines patterned in thick layers with variable edge geometry: theory,” J. Opt. Soc. Am. A 5,1270-1280 (1988).
-
(1988)
J. Opt. Soc. Am. A
, vol.5
, pp. 1270-1280
-
-
Nyyssonen, D.1
Kirk, C.P.2
-
7
-
-
0025595451
-
Modeling of optical alignment and metrology schemes used in IC manufacturing
-
Proc. Soc. Photo-Opt. Instrum. Eng
-
C. Yuan and A. J. Strojwas, “Modeling of optical alignment and metrology schemes used in IC manufacturing,” in Optical/La- ser Microlithography III, V. Pol, ed., Proc. Soc. Photo-Opt. Instrum. Eng. 1264, 203-218 (1990).
-
(1990)
Optical/La- Ser Microlithography III, V. Pol
, vol.1264
, pp. 203-218
-
-
Yuan, C.1
Strojwas, A.J.2
-
9
-
-
0001869632
-
Rigorous vector theory of diffraction gratings
-
E. Wolf, edNorth-Holland, Amsterdam
-
D. Maystre, “Rigorous vector theory of diffraction gratings,” in Progress in Optics, E. Wolf, ed. (North-Holland, Amsterdam, 1984), Vol. 21, p. 15.
-
(1984)
Progress in Optics
, vol.21
, pp. 15
-
-
Maystre, D.1
-
10
-
-
0037842469
-
-
Addison-Wesley, Reading, Mass
-
E. Hecht and A. Zajac, Optics (Addison-Wesley, Reading, Mass., 1974), pp. 465-467.
-
(1974)
Optics
, pp. 465-467
-
-
Hecht, E.1
Zajac, A.2
-
11
-
-
84975421557
-
New generation optical stepper with high n.A. g-line lens
-
B. J. Lin, ed., Proc. Soc. Photo-Opt. Instrum. Eng
-
H. Kawai, M. Nei, S. Murakami, M. Kameyama, S. Nakamura, K. Ushida, and K. Matsumoto, “New generation optical stepper with high n.a. g-line lens,” in Optical/Laser Microlithography II, B. J. Lin, ed., Proc. Soc. Photo-Opt. Instrum. Eng. 1088,170-177 (1989).
-
(1989)
Optical/Laser Microlithography II
, vol.1088
, pp. 170-177
-
-
Kawai, H.1
Nei, M.2
Murakami, S.3
Kameyama, M.4
Nakamura, S.5
Ushida, K.6
Matsumoto, K.7
-
13
-
-
84941872265
-
Phase detection using scanning optical microscopy
-
K. M. Monahan, ed., Proc. Soc. Photo-Opt. Instrum. Eng
-
J. P. H. Benschop, “Phase detection using scanning optical microscopy,” in Integrated Circuit Metrology, Inspection, and Process Control, K. M. Monahan, ed., Proc. Soc. Photo-Opt. Instrum. Eng. 921,123-130 (1988).
-
(1988)
Integrated Circuit Metrology, Inspection, and Process Control
, vol.921
, pp. 123-130
-
-
Benschop, J.P.H.1
-
14
-
-
0018433491
-
Quantitative surface topography determination by Nomarski reflection microscopy. I. Theory
-
D. L. Lessor, J. S. Hartman, and R. L. Gordon, “Quantitative surface topography determination by Nomarski reflection microscopy. I. Theory,” J. Opt. Soc. Am. 69,357-366 (1979).
-
(1979)
J. Opt. Soc. Am.
, vol.69
, pp. 357-366
-
-
Lessor, D.L.1
Hartman, J.S.2
Gordon, R.L.3
-
15
-
-
0343942232
-
Surface roughness evaluation by image analysis in Nomarski DIC microscopy
-
B. Truax, ed., Proc. Soc. Photo-Opt. Instrum. Eng
-
M. J. Fairlie, J. G. Akkerman, R. S. Timsit, and J. M. Zavislan, “Surface roughness evaluation by image analysis in Nomarski DIC microscopy,” in Metrology: Figure and Finish, B. Truax, ed., Proc. Soc. Photo-Opt. Instrum. Eng. 749,105-113 (1987).
-
(1987)
Metrology: Figure and Finish
, vol.749
, pp. 105-113
-
-
Fairlie, M.J.1
Akkerman, J.G.2
Timsit, R.S.3
Zavislan, J.M.4
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