High precision retardation measurement using phase detection of young’s fringes

Applied Optics

Volumn 29, Issue 2, 1990, Pages 242-246

  Nakadate, Suezou ^a,b  

^a INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

^b TOKYO POLYTECHNIC UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84975662189     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.29.000242     Document Type: Article

References (12)

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