High-energy x-ray response of photographic films: Models and measurement

Journal of the Optical Society of America B: Optical Physics

Volumn 3, Issue 11, 1986, Pages 1540-1550

  Henke, B L ^a   Uejio, J Y ^a   Stone, G F ^b   Dittmore, C H ^b   Fujiwara, F G ^c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF HAWAII   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84975661839     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.3.001540     Document Type: Article

References (8)

1. B. L. Henke and P. A. Jaanimagi, “Two-channel, elliptical analyzer spectrograph for absolute, time-resolving time-integrating spectrometry of pulsed x-ray sources in the 100-10, 000 eV region,” Rev. Sci. Instrum. 56, 1537-1552 (1985).
2. B. L. Henke, S. L. Kwok, J. Y. Uejio, H. T. Yamada, and G. C. Young, “Low-energy x-ray response of photographic films. I. Mathematical models,” J. Opt. Soc. Am. B 1, 818-827 (1984).
3. B. L. Henke, F. G. Fujiwara, M. A. Tester, C. H. Dittmore, and M. A. Palmer, “Low-energy x-ray response of photographic films. II. Experimental characterization,” J. Opt. Soc. Am. B 1, 828-849 (1984).
4. W. C. Phillips and G. N. Phillips, Jr., “Two new x-ray films: Conditions for optimum development and calibration of response,” J. Appl. Cryst. 18, 3-7 (1985).
5. P. D. Rockett, C. R. Bird, C. J. Hailey, D. Sullivan, D. B. Brown, and P. G. Burkhalter, “X-ray calibration of Kodak direct exposure film,” Appl. Opt. 24, 2536-2542 (1985).
6. B. L. Henke, H. T. Yamada, and T. J. Tanaka, “Pulsed plasma source spectrometry in the 80-8000-eV x-ray region,” Rev. Sci. Instrum. 54, 1311-1330 (1983).
7. B. L. Henke, P. Lee, T. J. Tanaka, R. L. Shimabukuro, and B. K. Fujikawa, “Low-energy x-ray interaction coefficients: Photoabsorption, scattering, and reflection. E = 100-2000 eV, Z = 1 to 94,” At. Data Nucl. Data Tables 27, 1-44 (1982).
8. L. N. Koppel and M. J. Boyle, “X-ray calibration of film types SB-5 and RAR 2492 in the 1.5-8-keV region,” Document No. FR-81-112-Sec. IV (Advanced Research and Applications Corp., Sunnyvale, Calif., 1981).