Resolving power of 35, 000 (5 ma) in the extreme ultraviolet employing a grazing incidence spectrometer

Applied Optics

Volumn 27, Issue 2, 1988, Pages 200-202

  Hettrick, Michael C ^a   Underwood, James H ^c   Batson, Philip J ^c   Eckart, Mark J ^b  

^a Hettrick Scientific ^*  (United States)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84975633418     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.27.000200     Document Type: Article

References (12)

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10. E. Janitti, P. Nicolosi, and G. Tondello, “Stigmatic Observations of Laser-Produced Plasmas with a Grazing-Incidence Spectrograph,” Opt. Lett. 4, 187 (1979).
11. J. L. Schwob, A. W. Wouters, S. Suckewer, and M. Finkenthal, “High-Resolution Duo-Multichannel Soft X-Ray Spectrometer for Tokamak Plasma Diagnostic,” submitted to J. Opt. Soc. Am.
12. M. C. Hettrick, “High Resolution Gratings for the Soft X-Ray: Aberration Correction Methods and Their Limitations,” in Proceedings, Synchrotron Radiation Instrumentation Conference(Madison, WI, 1987), to appear in Nucl. Instrum. Methods(1988).