Homogeneity testing by phase sampling interferometry

Applied Optics

Volumn 24, Issue 18, 1985, Pages 3059-3061

  Schwider, Johannes ^a   Burow, R ^a   Elssner, K E ^a   Spolaczyk, R ^a   Grzanna, J ^a  

^a Zentralinstitut für Optik und Spektroskopie ^*  (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84975625095     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.24.003059     Document Type: Article

References (11)

1. F. Twyman and J. W. Perry, “Measuring Small Differences of Refractive Index, ” Proc. Phys. Soc. London 34, 151 (1922)
2. C. Candler, Modern Interferometers(Hilger and Watts, London, 1951).
3. F. E. Roberts and P. Langenbeck, “Homogeneity Evaluation of Very Large Disks, ” Appl. Opt. 8, 2311 (1969).
4. J. Schwider, “Interferometrische Homogenitatsprufung mitKompensation, ” Opt. Commun. 6, 106 (1972).
5. J. H. Bruning, J. E. Gallagher, D. P. Rosenfeld, A. D. White, D. J. Brangaccio, and D. R. Herriott, “Digital Wavefront Measuring Interferometer for Testing Optical Surfaces and Lenses, ” Appl. Opt. 13, 2693 (1974).
6. J. Schwider, R. Burow, K.-E. Elssner, J. Grzanna, R. Spolaczyk, and K. Merkel, “Digital Wave-Front Measuring Interferometry: Some Systematic Error Sources, ” Appl. Opt. 22, 3421 (1983)
7. J. Schwideret al., “High Accuracy Phase Measurement in Real Time, ” Proc. Soc. Photo-Opt. Instrum. Eng. 473, 156 (1984)
8. J. Schwideret al., “Echtzeitinterferometrie, ” Opt. Appl. 15, (1985), in press
9. J. Schwideret al., “Echtzeitinterferometer fur die Op-tikpriifung, ” Opt. Appl. 15, (1985), in press.
10. R. Dandliker, “Heterodyne Holographic Interferometry, ” Prog. Opt. 17, 1 (1980)
11. N. A. Massie, R. D. Nelson, and S. Holly, “High-Performance Real-Time Heterodyne Interferometry, ” Appl. Opt. 18, 1797 (1979).