Guided-wave reflectometry with micrometer resolution

Applied Optics

Volumn 26, Issue 14, 1987, Pages 2836-2841

  Danielson, B L ^a   Whittenberg, C D ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84975624533     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.26.002836     Document Type: Article

References (24)

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