Effects of restricting the detector field of view when using integrating spheres

Applied Optics

Volumn 28, Issue 11, 1989, Pages 2097-2103

  Hanssen, Leonard M ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84975624084     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.28.002097     Document Type: Article

References (22)

1. R. Ulbricht, "Photometer for Mean Spherical Candle-Power," Electrotech. Zeit. 21, 595-597 (1900).
2. D. K. Edwards, J. T. Gier, K. E. Nelson, and R. D. Roddick, "Integrating Sphere for Imperfectly Diffuse Samples," J. Opt. Soc. Am. 51, 1279-1288 (1961).
3. J. A. Jacquez and H. F. Kuppenheim, "Theory of the Integrating Sphere," J. Opt. Soc. Am. 45, 460-470 (1955).
4. R. T. Neher and D. K. Edwards, "Far Infrared Reflectometer for Imperfectly Diffuse Specimens," Appl. Opt. 4, 775-780 (1965).
5. M. W. Finkel, "Integrating Sphere Theory," Opt. Commun. 2, 25-28 (1970).
6. A. H. Taylor, "The Measurement of Diffuse Reflection Factors and a New Absolute Reflectometer," J. Opt. Soc. Am. 4, 9-23 (1920).
7. A. H. Taylor, "Errors in Reflectometry," J. Opt. Soc. Am. 25, 51-56 (1935).
8. F. J. J. Clarke and J. A. Compton, "Correction Methods for Integrating-Sphere Measurement for Hemispherical Reflectance," Color Res. Appl. 11, 253-262 (1986).
9. G. J. Kneissl and J. C. Richmond, "A Laser-Source Integrating Sphere Reflectometer," Natl. Bur. Stand. US Tech. Note 439 (Feb. 1968).
10. K. A. Snail and K. F. Carr, "Optical Design of an Integrating Sphere-Fourier Transform Spectrophotometer (FTS) Emissometer," Proc. Soc. Photo-Opt. Instrum. Eng. 643, 75-83 (1985).
11. L. M. Hanssen and K. A. Snail, "Infrared Diffuse Reflectometer for Spectral, Angular and Temperature Resolved Measurements," Proc. Soc. Photo-Opt. Instrum. Eng. 807, 148-159 (1987).
12. K. A. Snail, K. F. Carr, and L. M. Hanssen, "Integrating Sphere Measurements Using Restricted Field of View Detectors," submitted to Applied Optics.
13. B. J. Hisdal, "Reflectance of Perfect Diffuse Specular Samples in the Integrating Sphere," J. Opt. Soc. Am. 55, 1122-1128 (1965).
14. The equation within the text between Eqs. (4) and (5) of Ref. 5 assumes that the flat sample and/or reference conform to the sphere (i.e., are curved to match the sphere wall). This is in contrast to the more accurate approximation of Eq. (3.1) of Ref. 3.
15. H. L. Tardy, "Flat-Sample and Limited-Field Effects in Integrating Sphere Measurements," J. Opt. Soc. Am. A 5, 241-245 (1988).
16. K. A. Snail and L. M. Hanssen, "Integrating Sphere Designs with Isotropic Throughput," Appl. Opt. 28, 1793 (1959).
17. W. Budde, "Calibration of Reflectance Standards," J. Res. Natl. Bur. Stand Sect. A 80, 585 (1976).
18. Hemispherical total reflectance refers to the hemispherically integrated radiation reflected off a sample which is ratioed to the diffusely incident radiation from the same hemisphere. In general, this is not equal to the directional/hemispherical reflectance, which is the ratio of the hemispherically collected radiation off a sample to radiation incident from a specific direction (often normal). The directional/hemispherical reflectance is the quantity referred to by the ρ terms in this paper. See F. E. Nicodemus, "Reflectance Nomenclature and Directional Reflectance and Emissivity," Appl. Opt. 9, 1474-1475 (1970)
19. J. J. Hsia and J. C. Richmond, "Bidirectional Reflectometry. Part 1," J. Res. Natl. Bur. Stand. Sect. A 80, 189-205 (1976);
20. R. Siegel and J. R. Howell, Thermal Radiation Heat Transfer (McGraw- Hill, New York, 1981), pp. 64+.
21. F. A. Benford, "An Absolute Method for Determining Coefficients of Diffuse Reflection," Gen. Elect. Rev. 23, 72-76 (1920).
22. D. G. Goebel, "Generalized Integrating Sphere Theory," Appl. Opt. 6, 125-128 (1967). Note that his equations as shown are missing many parentheses and a/in the last equation.