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Relation between light scattering and morphology of columnar structured optical thin films
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Surface smoothing and roughening by dielectric thin film deposition
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Optical scattering from oxidized metals. 1: Model formulation and properties
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Structure- related bulk losses in Zr02 optical thin films
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A. Duparre, E. Welsch, H.-G. Walther, N. Kaiser, H. Müller, E. Hacker, H. Lauth, J. Meyer, and P. Weissbrodt, “Structure- related bulk losses in Zr02 optical thin films,” Thin Solid Films 187, 275-288 (1990).
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The influence of angle limitation in light scattering measurements on the determination of the reflectance of multilayer dielectric mirrors
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A. Duparré, C.-P. Darr, G. Schirmer, H. Truckenbrodt, and M. Weiss, “The influence of angle limitation in light scattering measurements on the determination of the reflectance of multilayer dielectric mirrors,” Optik 72, 153-156 (1986).
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to be published
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