Absolute reflectometer for the mid infrared region

Applied Optics

Volumn 29, Issue 1, 1990, Pages 129-132

  Sheffer, Dan ^a   Oppenheim, Uri P ^a   Devir, Adam D ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84975602308     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.29.000129     Document Type: Article

References (6)

1. W. Budde, “Calibration of Reflectance Standards,” J. Res. Natl. Bur. Stand. Sect. A 80, 585-595 (1976).
2. W. Budde and C. X. Dodd, “Absolute Reflectance Measurements in the Geometry,” Die Farbe 19, 94-102 (1970).
3. D. Sheffer, U. P. Oppenheim, D. Clement, and A. D. Devir, “Absolute Reflectometer for the 0.8-2.5-m Region,” Appl. Opt. 26, 583-586 (1987).
4. C. H. Sharp and W. F. Little, “Measurement of Reflection Factors,” Trans. Ilium. Eng. Soc. 15, 802-810 (1920).
5. F. J. J. Clark and D. J. Parry, “Helmholtz Reciprocity: Its Validity and Application to Reflectometry,” Light. Res. Technol. 17, 1-11 (1985).
6. W. L. Wolfe and G. J. Zissis, Eds., The Infrared Handbook (Environmental Research Institute of Michigan, Ann Arbor, 1978), Chap. 7, pp. 7-81.