-
1
-
-
0016128770
-
Digital Wavefront Measuring Interferometer for Testing Optical Surfaces and Lenses
-
J. H. Bruning, D. R. Herriott, J. E. Gallagher, D. P. Rosenfeld, A. D. White, and D. J. Brangaccio, “Digital Wavefront Measuring Interferometer for Testing Optical Surfaces and Lenses,” Appl. Opt. 13, 2693-2703 (1974).
-
(1974)
Appl. Opt.
, vol.13
, pp. 2693-2703
-
-
Bruning, J.H.1
Herriott, D.R.2
Gallagher, J.E.3
Rosenfeld, D.P.4
White, A.D.5
Brangaccio, D.J.6
-
2
-
-
0021815465
-
Measurement of Surface Topography of Magnetic Tapes by Mirau Interferometry
-
B. Bhushan, J. C. Wyant, and C. L. Koliopoulos, “Measurement of Surface Topography of Magnetic Tapes by Mirau Interferometry,” Appl. Opt. 24, 1489-1497 (1985).
-
(1985)
Appl. Opt.
, vol.24
, pp. 1489-1497
-
-
Bhushan, B.1
Wyant, J.C.2
Koliopoulos, C.L.3
-
3
-
-
84947820959
-
Contouring Aspheric Surfaces Using Two-Wavelength Phase-Shifting Interferometry
-
K. Creath, Y.-Y. Cheng, and J. C. Wyant, “Contouring Aspheric Surfaces Using Two-Wavelength Phase-Shifting Interferometry,” Opt. Acta 32, 1455-1464 (1985).
-
(1985)
Opt. Acta
, vol.32
, pp. 1455-1464
-
-
Creath, K.1
Cheng, Y.-Y.2
Wyant, J.C.3
-
4
-
-
84975611860
-
Wavefront Measurement of Optical Waveguides by Digital Inteferometry
-
F. H. Groen, H. J. Frankena, and A. Apituley, “Wavefront Measurement of Optical Waveguides by Digital Inteferometry,” ECOISA Summaries, F3, Amsterdam (1989).
-
(1989)
ECOISA Summaries, F3, Amsterdam
-
-
Groen, F.H.1
Frankena, H.J.2
Apituley, A.3
-
5
-
-
84958494493
-
In-Plane Strain Measurement by Digital Phase Shifting Speckle Interferometry
-
A. A. M. Maas and H. A. Vrooman, “In-Plane Strain Measurement by Digital Phase Shifting Speckle Interferometry,” Proc. Soc. Photo-Opt. Instrum. Eng. 1162, 248-256 (1989).
-
(1989)
Proc. Soc. Photo-Opt. Instrum. Eng.
, vol.1162
, pp. 248-256
-
-
Maas, A.A.M.1
Vrooman, H.A.2
-
6
-
-
84975647445
-
Phase-Measurement Interferometry Techniques
-
K. Creath, “Phase-Measurement Interferometry Techniques,” Prog Optics 26, 351-398 (1988).
-
(1988)
Prog Optics
, vol.26
, pp. 351-398
-
-
Creath, K.1
-
7
-
-
0022948569
-
Comparisons of Phase-Measurement Algorithms
-
K. Creath, “Comparisons of Phase-Measurement Algorithms,” in Proc. Soc. Photo-Opt. Instrum. Eng. 680, 19-28 (1986).
-
(1986)
Proc. Soc. Photo-Opt. Instrum. Eng.
, vol.680
, pp. 19-28
-
-
Creath, K.1
-
8
-
-
84975576101
-
Effect of Piezoelectric Transducer Nonlinearity on Phase Shift Interferometry
-
C. Ai and J. C. Wyant, “Effect of Piezoelectric Transducer Nonlinearity on Phase Shift Interferometry,” Appl. Opt. 26, 1112-1116 (1987).
-
(1987)
Appl. Opt.
, vol.26
, pp. 1112-1116
-
-
Ai, C.1
Wyant, J.C.2
-
9
-
-
0020844269
-
Digital Wave-Front Measuring Interferometry: Some Systematic Error Sources
-
J. Schwider, R. Burow, K.-E. Elssner, J. Grzanna, R. Spolaczyk, and K. Merkel, “Digital Wave-Front Measuring Interferometry: Some Systematic Error Sources,” Appl. Opt. 22, 3421-3432 (1983).
-
(1983)
Appl. Opt.
, vol.22
, pp. 3421-3432
-
-
Schwider, J.1
Burow, R.2
Elssner, K.-E.3
Grzanna, J.4
Spolaczyk, R.5
Merkel, K.6
-
10
-
-
84928815585
-
Digitial Phase-Shifting Interferometry: A Simple Error-Compensating Phase Calculation Algorithm
-
P. Hariharan, B. F. Oreb, and T. Eiju, “Digitial Phase-Shifting Interferometry: A Simple Error-Compensating Phase Calculation Algorithm,” Appl. Opt. 26, 2504-2506 (1987).
-
(1987)
Appl. Opt.
, vol.26
, pp. 2504-2506
-
-
Hariharan, P.1
Oreb, B.F.2
Eiju, T.3
-
11
-
-
84975606596
-
Accuracy of Phase Shifting Interferometry
-
K. Kinnstaetter, A. W. Lohmann, J. Schwider, and N. Streibl, “Accuracy of Phase Shifting Interferometry,” Appl. Opt. 27, 5082-5089 (1988).
-
(1988)
Appl. Opt.
, vol.27
, pp. 5082-5089
-
-
Kinnstaetter, K.1
Lohmann, A.W.2
Schwider, J.3
Streibl, N.4
-
12
-
-
0021412722
-
An Optical Profilometer for Surface Characterization of Magnetic Media
-
J. C. Wyant, C. L. Koliopoulos, B. Bhushan, and O. E. George, “An Optical Profilometer for Surface Characterization of Magnetic Media,” ASLE Trans. 27, 101-113 (1984).
-
(1984)
ASLE Trans
, vol.27
, pp. 101-113
-
-
Wyant, J.C.1
Koliopoulos, C.L.2
Bhushan, B.3
George, O.E.4
-
13
-
-
0002834304
-
Installation et utilisation du comparateur photoelec- trique et interferentiel du Bureau International des Poids et Mesures
-
P. Carre, “Installation et utilisation du comparateur photoelec- trique et interferentiel du Bureau International des Poids et Mesures,” Metrologia 2, 13-23 (1966).
-
(1966)
Metrologia
, vol.2
, pp. 13-23
-
-
Carre, P.1
-
14
-
-
84975598554
-
Electrooptic Holography and Its Application to Hologram Interferometry
-
K. A. Stetson and W. R. Brohinsky, “Electrooptic Holography and Its Application to Hologram Interferometry,” Appl. Opt. 24, 3631-3637 (1985).
-
(1985)
Appl. Opt.
, vol.24
, pp. 3631-3637
-
-
Stetson, K.A.1
Brohinsky, W.R.2
|