-
1
-
-
0023384262
-
Trench Depth Measurement System for VLSI DRAMs Capacitor Cells Using Optical Fiber and Michelson Interferometer
-
K. Takada, K. Chida, J. Noda, and S. Nakajima, “Trench Depth Measurement System for VLSI DRAM’s Capacitor Cells Using Optical Fiber and Michelson Interferometer,” IEEE/OSA J. Lightwave Technol. LT-5, 881-887 (1987).
-
(1987)
IEEE/OSA J. Lightwave Technol. LT-5
, pp. 881-887
-
-
Takada, K.1
Chida, K.2
Noda, J.3
Nakajima, S.4
-
2
-
-
0021664473
-
High Accuracy Position Sensing with Fiber Coupled White-Light Interferometers
-
VDE-Verlag, Berlin
-
T. H. Bosselmann and R. Ulrich, “High Accuracy Position Sensing with Fiber Coupled White-Light Interferometers,” in Proceedings, Second International Conference on Optical Fiber Sensors (VDE-Verlag, Berlin, 1984), pp. 361-364.
-
(1984)
Proceedings, Second International Conference on Optical Fiber Sensors
, pp. 361-364
-
-
Bosselmann, T.H.1
Ulrich, R.2
-
3
-
-
0023648497
-
Interferometric Fiber-Optic Sensor Using a Short-Coherence Length Source
-
A. S. Gerges, F. Farah, T. P. Newson, J. D. C. Jones, and D. A. Jackson, “Interferometric Fiber-Optic Sensor Using a Short-Coherence Length Source,” Electron. Lett. 23, 1110-1111(1987).
-
(1987)
Electron. Lett.
, vol.23
, pp. 1110-1111
-
-
Gerges, A.S.1
Farah, F.2
Newson, T.P.3
Jones, J.D.C.4
Jackson, D.A.5
-
4
-
-
84975590022
-
Absolute Displacement Measurements Using Modulation of the Spectrum of White Light in a Michelson Interferometer
-
L. M. Smith and C. C. Dobson, “Absolute Displacement Measurements Using Modulation of the Spectrum of White Light in a Michelson Interferometer,” Appl. Opt. 28, 3339-3342 (1989).
-
(1989)
Appl. Opt.
, vol.28
, pp. 3339-3342
-
-
Smith, L.M.1
Dobson, C.C.2
-
5
-
-
84975603077
-
White-Light Interferometric Thickness Gauge
-
P. A. Fluornoy, R. W. McClure, and G. Wyntjes, “White-Light Interferometric Thickness Gauge,” Appl. Opt. 11, 1907-1915(1972).
-
(1972)
Appl. Opt.
, vol.11
, pp. 1907-1915
-
-
Fluornoy, P.A.1
McClure, R.W.2
Wyntjes, G.3
-
6
-
-
84975564604
-
Characterization of Silica-Based Waveguides with an Interferometric Optical Time-Domain Reflectometry System Using a 1.3-^m-Wave-length Superluminescent Diode
-
K. Takada, N. Takato, J. Noda, and Y. Noguchi, “Characterization of Silica-Based Waveguides with an Interferometric Optical Time-Domain Reflectometry System Using a 1.3-^m-Wave-length Superluminescent Diode,” Opt. Lett. 14, 706-708 (1989).
-
(1989)
Opt. Lett.
, vol.14
, pp. 706-708
-
-
Takada, K.1
Takato, N.2
Noda, J.3
Noguchi, Y.4
-
8
-
-
84975628448
-
-
i, Instrumentation, K. J. Button, Ed. (Academic, New York, Chap
-
J. R. Birch and T. J. Parkeer, “Dispersive Fourier Transform Spectroscopy,” in Infrared and Millimeter Waves. Vol. 2: Instrumentation, K. J. Button, Ed. (Academic, New York, 1979), Chap. 3.
-
(1979)
Dispersive Fourier Transform Spectroscopy
, vol.2
, pp. 3
-
-
Birch, J.R.1
Parkeer, T.J.2
-
9
-
-
0024627214
-
Three Ways to Implement Interferencial Techniques: Application to Measurements of Chromatic Dispersion, Birefringence, and Nonlinear Susceptibilities
-
P.-L. Francois, M. Monerie, C. Vassallo, Y. Durteste, and F. R. Alard, “Three Ways to Implement Interferencial Techniques: Application to Measurements of Chromatic Dispersion, Birefringence, and Nonlinear Susceptibilities,” IEEE/OSA J. Lightwave Technol. LT-7, 500-513 (1989).
-
(1989)
IEEE/OSA J. Lightwave Technol. LT-7
, pp. 500-513
-
-
Francois, P.-L.1
Monerie, M.2
Vassallo, C.3
Durteste, Y.4
Alard, F.R.5
-
10
-
-
0037688787
-
Dispersive Fourier Transform Spectroscopy
-
Instrumentation, K. J. Button, Ed. (Academic, New York
-
J. R. Birch and T. J. Parkeer, “Dispersive Fourier Transform Spectroscopy,” in Infrared and Millimeter Waves. Vol. 2: Instrumentation, K. J. Button, Ed. (Academic, New York, 1979), Chap. 3, p. 92.
-
(1979)
Infrared and Millimeter Waves
, vol.2
, pp. 92
-
-
Birch, J.R.1
Parkeer, T.J.2
-
11
-
-
0024134085
-
Interferometric Dispersion Measurements on Small Guided-Wave Structures
-
B. L. Danielson and C. D. Whittenberg, “Interferometric Dispersion Measurements on Small Guided-Wave Structures,” in Technical Digest, Conference on Lasers and Electro-Optics (Optical Society of America, Washington, DC, 1988), pp. 360-361.
-
(1988)
Technical Digest, Conference on Lasers and Electro-Optics
, pp. 360-361
-
-
Danielson, B.L.1
Whittenberg, C.D.2
-
14
-
-
0012727863
-
Properties of Optical Materials
-
W. G. Driscoll and W. Vaughan, Eds.McGraw-Hill, New York
-
W. L. Wolfe, “Properties of Optical Materials,” in Handbook of Optics, W. G. Driscoll and W. Vaughan, Eds. (McGraw-Hill, New York, 1978), Sec. 7.
-
(1978)
Handbook of Optics
, vol.7
-
-
Wolfe, W.L.1
-
16
-
-
84975583329
-
Measurement of Chromatic Dispersions in Ti-Diffused LiNbOg Optical Waveguides
-
K. Okamoto, T. Hosaka, and H. Itoh, “Measurement of Chromatic Dispersions in Ti-Diffused LiNbOg Optical Waveguides,”Opt. Lett. 13, 65-67 (1988).
-
(1988)
Opt. Lett.
, vol.13
, pp. 65-67
-
-
Okamoto, K.1
Hosaka, T.2
Itoh, H.3
|