Color representation using statistical pattern recognition

Applied Optics

Volumn 26, Issue 19, 1987, Pages 4190-4192

  Parkkinen, Jussi ^a,b   Jaaskelainen, Timo ^a,c  

^a UNIVERSITY OF EASTERN FINLAND   (Finland)

^b Department of Computer Science and Mathematics ^*  (Finland)

^c Physics Department ^*  (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84975582347     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.26.004240     Document Type: Article

References (14)

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3. A. R. Robertson, “The CIE 1976 Color Difference Formulae,” Color Res. Appl. 2, 7 (1977).
4. R. D. Lozano, “Evaluation of Different Color-Difference Formulae by Means of an Experiment on Color Scaling,” Color Res. Appl. 2, 13 (1977).
5. T. Benzschawel and S. L. Guth, “ATDN: Toward a Uniform Color Space,” Color Res. Appl. 9, 133 (1984).
6. R. M. Boynton, A. L. Nagy, and C. X. Olson, “A Flaw Equation for Predicting Chromatic Differences,” Color Res. Appl. 8, 69(1983).
7. D. C. Rich and W. Billmeyer, Jr., “Small and Moderate Color Differences IV, Color-Difference-Perceptibility Ellipses in Surface Color Space,” Color Res. Appl. 8, 31 (1983).
8. D. L. MacAdam, “Uniform Color Scales,” J. Opt. Soc. Am. 64, 1691 (1974).
9. R. M. Boynton, Human Color Vision (Holt, Rinehart, & Winston, New York, 1979).
10. R. M. Boynton, Surface Colours for Visual Signalling, CIE Publication No. 39 (Tc-1.6) (1978).
11. T. Jaaskelainen, J. Parkkinen, and E. Oja, “Color Discrimination by Optical Pattern Recognition,” in Proceedings Eighth International Conference on Pattern Recognition, Paris (1986), p. 766.
12. J. P. S. Parkkinen, T. Jaaskelainen, and E. Oja, “Pattern Recognition Approach to Color Measurement and Discrimination,” Acta Polytech. Scand. Appl. Phys. Ser. 7, No. 149, 171 (1985).
13. E. Oja, Subspace Methods of Pattern Recognition (Research Studies Press, Letchworth, England, 1983).
14. N. Nandhakumar and J. K. Aggarwal “The Artificial Intelligence Approach to Pattern Recognition−A Perspective and an Overview,” Pattern Recognition 18, 383 (1985).