Noise characterization of a self-mode-locked Ti:sapphire laser

Optics Letters

Volumn 17, Issue 10, 1992, Pages 733-735

  Son, J ^a   Rudd, J V ^a   Whitaker, J F ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

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Indexed keywords

EID: 84975575228     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.17.000733     Document Type: Article

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