New measurement system for fault location in optical waveguide devices based on an interferometric technique

Applied Optics

Volumn 26, Issue 9, 1987, Pages 1603-1606

  Takada, Kazumasa ^a   Yokohama, Itaru ^a   Chida, Kazumori ^a   Noda, Juichi ^a  

^a NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84975568379     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.26.001603     Document Type: Article

References (10)

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