The low-frequency noise behavior of gate-all-around SOI transistors

Proceedings - IEEE International SOI Conference

Volumn , Issue , 1992, Pages 116-117

  Simoen, E ^a   Magnusson, U ^a   Claevs, C ^a   Colinge, J P ^b  

^a IMEC   (Belgium)

^b UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84975433669     PISSN: 1078621X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SOI.1992.664821     Document Type: Conference Paper

References (11)

1. J. P. Colinge, M. H. Gao, A. Romano-Rodriguez, H. Maes and C. Claeys, IEDM Tech. Digest, 595 (1990).
2. R. K. Lawrence, J. P. Colinge and H. L. Hughes, Proc. of the 1991 IEEE Intern. SOI Conference, 80 (1991).
3. M. J. Uren and M. J. Kirton, Adv. Physics vol. 38, 67 (1990).
4. O. Roux, G. Ghibaudo, J. Brini and T. Ouisse, Ext. Abstr. of the ECS Spring Meeting vol. 92-1, 287 (1992).
5. E. Simoen, U. Magnusson and C. Claeys, paper to be published in the Proc. of the E-MRS Spring Meeting, Strasbourg (Fr.), 1-5 June 1992.
6. E. Simoen, B. Dierickx and C. Claeys, paper submitted to Appl. Phys. lett.
7. E. Simoen and C. Claeys, Ext Abstr. of the ECS Spring Meeting vol. 92-1 (1992).
8. E. Simoen, B. Dierickx and C. Claeys, Electron Lett. vol. 28, 577 (1992) and paper accepted by J. Appl. Phys.
9. G. Ghibaudo, Solid-State Electron, vol. 30, 1037 (1987).
10. J. Chen, P. Fang, P. K. Ko, C. Hu, R. Solomon, T.-Y. Chan and C. G. Sodini, Proc. of the 1990 IEEE SOS/SOI Technol. Conf., Key West (Florida), 40 (1990).
11. J. P. Colinge, IEEE Trans. Electron Devices vol. 37, 718 (1990).