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Volumn 117, Issue 10, 1970, Pages 1310-1314

Growth Characteristics of Rutile Film by Chemical Vapor Deposition

Author keywords

deposition; dielectric; epitaxy; film; growth; nucleation; orientation; rutile

Indexed keywords


EID: 84975349637     PISSN: 00134651     EISSN: 19457111     Source Type: Journal    
DOI: 10.1149/1.2407298     Document Type: Article
Times cited : (46)

References (17)
  • 1
    • 84975336170 scopus 로고
    • Alloys and Compounds, Gatlinburg, Tenn., Sept. 12-14, Am. Nucl. Soc. (1967).
    • Proc. Conf. Chem. Vap. Deposition of Refractory Metals, Alloys and Compounds, Gatlinburg, Tenn., Sept. 12-14, 1967, Am. Nucl. Soc. (1967).
    • (1967) Proc. Conf. Chem. Vap. Deposition of Refractory Metals
  • 3
    • 0003551768 scopus 로고
    • Vacuum Deposition of Thin Films
    • J. Wiley & Sons, Inc., New York
    • L. Holland, “Vacuum Deposition of Thin Films,” p. 466, J. Wiley & Sons, Inc., New York (1956).
    • (1956) , pp. 466
    • Holland, L.1
  • 7
    • 84975361302 scopus 로고
    • R.N. Ghoshtagore, Journal of the Electrochemical Society, 117, 529 (1970).
    • (1970) , vol.117 , pp. 529
    • Ghoshtagore, R.N.1
  • 8
    • 0142087204 scopus 로고
    • T.L. Chu, J.R. Szedon, and G.A. Gruber, Trans. Met. Soc. AIME, 242, 532 (1968).
    • E.F. Cave and B.R. Czorny, RCA Rev., 24, 523 (1963); T.L. Chu, J.R. Szedon, and G.A. Gruber, Trans. Met. Soc. AIME, 242, 532 (1968).
    • (1963) RCA Rev. , vol.24 , pp. 523
    • Cave, E.F.1    Czorny, B.R.2
  • 9
    • 83255180481 scopus 로고
    • Dow Chemical Co., Midland, Mich., Dec. 13
    • JANAF Interim Thermochemical Tables, Dow Chemical Co., Midland, Mich., Dec. 13, 1960.
    • (1960) JANAF Interim Thermochemical Tables
  • 10
    • 36849134197 scopus 로고
    • J.J. Lander and J. Morrison, 33, 2089 (1962); F. Jona, Appl. Phys. Letters, 6, 205 (1965).
    • H.D. Hagstrum, J. Appl. Phys., 32, 1020 (1961); J.J. Lander and J. Morrison, Midland, Mich., 33, 2089 (1962); F. Jona, Appl. Phys. Letters, 6, 205 (1965).
    • (1961) J. Appl. Phys. , vol.32 , pp. 1020
    • Hagstrum, H.D.1
  • 12
    • 84911725244 scopus 로고
    • Measurement Techniques for Thin Films
    • The Electrochemical Society, New York
    • B. Schwartz and N. Schwartz, Editors, “Measurement Techniques for Thin Films,” The Electrochemical Society, New York (1967).
    • (1967)
    • Schwartz, B.1    Schwartz, N.2
  • 15
    • 84975354374 scopus 로고
    • M. Duffy, K.H. Zaininger, C.C. Wang, 115, 61C (1968).
    • J.A. Aboaf, Journal of the Electrochemical Society, 114, 948 (1967); M. Duffy, K.H. Zaininger, and C.C. Wang, Nat. Bur. Standards, 115, 61C (1968).
    • (1967) Journal of the Electrochemical Society , vol.114 , pp. 948
    • Aboaf, J.A.1
  • 16
    • 84975430467 scopus 로고
    • Thin Film Dielectrics
    • F. Vratny, Editor, The Electrochemical Society, New York
    • D.R. Harbison and H.L. Taylor in “Thin Film Dielectrics,” pp. 254-278, F. Vratny, Editor, The Electrochemical Society, New York, (1969).
    • (1969) , pp. 254-278
    • Harbison, D.R.1    Taylor, H.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.