Photocurrent measurements of electron traps in SIMOX

Proceedings - IEEE International SOI Conference

Volumn , Issue , 1992, Pages 106-107

  Lawrence, R K ^a   Hughes, H L ^b   Revesz, A G ^c  

^a ARACOR   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

^c Revesz Associates   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84975348196     PISSN: 1078621X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SOI.1992.664817     Document Type: Conference Paper

References (2)

1. D. J. DiMaria, J. Appl. Phys. 47, 4073 (1976).
2. D. R. Young, E. A. Irene, D. J. DiMaria, R. F. DeKeersmaecker, and H. Z. Massoud, J. Appl. Phys. 50, 6366 (1976)