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Surface Science

Volumn 98, Issue 1-3, 1980, Pages 181-190

Temperature dependence of scattering in the inversion layer

(3) Hartstein, A a Fowler, A B a Albert, M a

a IBM T J WATSON RESEARCH CENTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84975338815 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/0039-6028(80)90492-6 Document Type: Article

Times cited : (67)

References (17)

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- Surfons and the Electron Mobility in Silicon Inversion Layers
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- See, for instance, 3rd ed., Wiley, New York
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.