Local, global, and nonlinear screening in twisted double-layer graphene

Proceedings of the National Academy of Sciences of the United States of America

Volumn 113, Issue 24, 2016, Pages 6623-6628

  Lu, Chih Pin ^a   Rodriguez Vega, Mrtin ^b   Li, Guohong ^a   Luican Mayer, Adina ^a,d   Watanabe, Kenji ^c   Taniguchi, Takashi ^c   Rossi, Enrico ^b   Andrei, Eva Y ^a  

^a RUTGERS UNIVERSITY   (United States)

^b Dept of Economics and Thomas Jefferson Program in Public Policy at the College of William and Mary   (United States)

^c NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^d UNIVERSITY OF OTTAWA   (Canada)

Author keywords

Graphene; Landau level spectroscopy; Screening; STM

Indexed keywords

GRAPHENE;

AMPLITUDE MODULATION; ARTICLE; CHEMICAL STRUCTURE; CYCLOTRON; ELECTRIC POTENTIAL; ELECTRONICS; LANDAU LEVEL SPECTROSCOPY; PHYSICAL PHENOMENA; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS; SCANNING TUNNELING MICROSCOPY; SCREENING TEST; SIMULATION; SPECTROSCOPY;

EID: 84974856036     PISSN: 00278424     EISSN: 10916490     Source Type: Journal    
DOI: 10.1073/pnas.1606278113     Document Type: Article

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