Linear behavior of a near-field optical scanning system

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 12, Issue 8, 1995, Pages 8-1682

  Kann, Joshua L ^a   Milster, Tom D ^a   Froehlich, Fred F ^a   Ziolkowski, Richard W ^a   Judkins, Justin B ^a  

^a UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84974670740     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.12.001677     Document Type: Article

References (20)

1. E. Betzig and J. K. Trautman, “Near-field optics: Mi­croscopy, spectroscopy, and surface modification beyond the diffraction limit,” Science 257, 189-195 (1992).
2. F. Froehlich, T. D. Milster, and R. Uber, “High-resolution lithography with a near-field scanning sub-wavelength aperture,” in Miniature and Micro-optics: Fabrication, C. Roychoudhuri and W. B. Veldkamp, eds., Proc. Soc. Photo- Opt. Instrum. Eng. 1751, 312-317 (1992).
3. E. Betzig, J. K. Trautman, R. Wolfe, E. M. Gyorgy, and P L. Finn, “Near-field magneto-optics and high density data stor­age,” Appl. Phys. Lett. 61, 142-144 (1992).
4. A. Dereux and D. W. Pohl, Near Field Optics, Vol. 242 of NATO Advanced Science Institutes Series E (Kluwer Aca­demic, Dordrecht, The Netherlands, 1993).
5. C. Girard and D. Courjon, “Model for scanning tunneling optical microscopy: A microscopic self-consistent approach,” Phys. Rev. B 42, 9340-9349 (1990).
6. C. Girard and X. Bouju, “Self-consistent study of dynamical and polarization effects in near-field optical microscopy,” J. Opt. Soc. Am. B 9, 298-305 (1992).
7. D. Van Labeke and D. Barchiesi, “Scanning-tunneling optical microscopy: A theoretical macroscopic approach,” J. Opt. Soc. Am. A 9, 732-739 (1992).
8. C. Girard and A. Dereux, “Optical spectroscopy of a surface at the nanometer scale: A theoretical study in real space,” Phys. Rev. B 49, 11344-11351 (1994).
9. S. Bozhevolnyi, S. Berntsen, and E. Bozhevolnaya, “Exten­sion of the macroscopic model for reflection near-field mi­croscopy: Regularization and image formation,” J. Opt. Soc. Am. A 11, 609-617 (1994).
10. L. Novotny, D. W. Pohl, and P Regli, “Light propagation through nanometer-sized structures: The two-dimensional- aperture scanning near-field optical microscope,” J. Opt. Soc. Am. A 11, 1768-1779 (1994).
11. J. L. Kann, T. D. Milster, F. Froehlich, R. W. Ziolkowski, and J. Judkins, “Numerical analysis of a two dimensional probe,” Ultramicroscopy 57, 251-256 (1995).
12. J. L. Kann, T. D. Milster, F. Froehlich, R. W. Ziolkowski, and J. Judkins, “Near-field optical detection of asperities in dielectric surfaces,” J. Opt. Soc. Am. A 12, 501-512 (1992).
13. K. S. Kunz and R. J. Luebbers, The Finite Difference Time Domain Method for Electromagnetics (CRC, Boca Raton, Fla., 1993), P 32.
14. J. W. Goodman, Introduction to Fourier Optics (McGraw- Hill, New York, 1968), pP 48-51.
15. M. Nieto-Vesperinas, Scattering and Diffraction in Physical Optics (Wiley, New York, 1991), pP 40-80.
16. J. D. Gaskill, Linear Systems, Fourier Transforms and Op­tics (Wiley, New York, 1978), pP 343-345.
17. A. Papoulis, The Fourier Integral and Its Applications (McGraw-Hill, New York, 1962), P 108-116.
18. W. J. Smith, Modern Optical Engineering (McGraw-Hill, New York, 1990), pP 345-351.
19. J. M. Vigoureux, F. Depasse, and C. Girard, “Superreso­lution of near-field optical microscopy defined from prop­erties of confined electromagnetic waves,” ApP Opt. 31, 3036-3045 (1992).
20. C. Pieralli, “Statistical estimation of point spread function applied to scanning near-field optical microscopy,” Opt. Com- mun. 108, 203-208 (1994).