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Volumn 36, Issue 5, 2003, Pages 813-818
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Combining AI, FDI, and statistical hypothesis-testing in a framework for diagnosis
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Author keywords
AI methods; Fault diagnosis; Fault isolation; FDI methods; Multiple faults; Noise
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Indexed keywords
ELECTRIC FAULT CURRENTS;
FAILURE ANALYSIS;
PLANT MANAGEMENT;
STATISTICAL TESTS;
FAULT ISOLATION;
FDI METHOD;
MODEL BASED DIAGNOSIS;
MULTIPLE FAULTS;
NOISE;
RESIDUAL GENERATION;
STATISTICAL HYPOTHESIS TESTING;
FAULT DETECTION;
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EID: 84974651407
PISSN: 14746670
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1016/S1474-6670(17)36593-X Document Type: Conference Paper |
Times cited : (35)
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References (9)
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