A method for interpreting the data from depth-sensing indentation instruments

Journal of Materials Research

Volumn 1, Issue 4, 1986, Pages 601-609

  Doerner, M F ^a,b   Nix, W D ^b  

^a IBM   (United States)

^b STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84974183414     PISSN: 08842914     EISSN: 20445326     Source Type: Journal    
DOI: 10.1557/JMR.1986.0601     Document Type: Article

References (10)

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10. S. Hannula, D. Stone, and C. Li (unpublished work).