Growth and low-energy electron microscopy characterizations of graphene and hexagonal boron nitride

Progress in Crystal Growth and Characterization of Materials

Volumn 62, Issue 2, 2016, Pages 155-176

  Hibino, H ^a,b   Wang, S ^b   Orofeo, C M ^b,d   Kageshima, H ^c  

^a KWANSEI GAKUIN UNIVERSITY   (Japan)

^b NTT Basic Research Laboratories   (Japan)

^c SHIMANE UNIVERSITY   (Japan)

^d NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

chemical vapor deposition; graphene; hexagonal boron nitride; low energy electron microscopy; two dimensional materials

Indexed keywords

BORON NITRIDE; CHARACTERIZATION; CHEMICAL VAPOR DEPOSITION; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTRONS; NITRIDES;

GROWTH TECHNIQUES; HEXAGONAL BORON NITRIDE; HIGH-QUALITY MATERIALS; LOW ENERGY ELECTRON MICROSCOPY; STRUCTURAL CHARACTERIZATION; STRUCTURAL FEATURE; TWO DIMENSIONAL (2 D); TWO-DIMENSIONAL MATERIALS;

GRAPHENE;

EID: 84973908881     PISSN: 09608974     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.pcrysgrow.2016.04.008     Document Type: Review

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