Detecting and locating faults in VLSI implementations of the Advanced Encryption Standard

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn 2003-January, Issue , 2003, Pages 105-112

  Bertoni, Guido ^a   Breveglieri, Luca ^a   Koren, Israel ^b   Maistri, Paolo ^a   Piuri, Vincenzo ^c  

^a POLITECNICO DI MILANO   (Italy)

^b University of Massachusetts   (United States)

^c UNIVERSITY OF MILAN   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DATA PRIVACY; DEFECTS; FAULT DETECTION; FAULT TOLERANCE; HARDWARE;

ADVANCED ENCRYPTION STANDARD; HARDWARE IMPLEMENTATIONS; PARITY CODES; RANDOM FAULTS; SECRET KEY; TRANSIENT AND PERMANENT FAULT; VLSI IMPLEMENTATION;

CRYPTOGRAPHY;

EID: 84971273010     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TSM.2005.1250101     Document Type: Conference Paper

References (11)

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