Phase retrieval as an optical metrology tool; Technical Digest

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 10315, Issue , 2005, Pages 139-141

  Brady, Gregory R ^a   Fienup, James R ^a  

^a UNIVERSITY OF ROCHESTER   (United States)

Author keywords

aspheric testing; optical metrology; Phase retrieval

Indexed keywords

ASPHERICS; UNITS OF MEASUREMENT; WAVEFRONTS;

ASPHERIC TESTING; DETECTOR ARRAYS; EXPERIMENTAL APPARATUS; FOCUS INTENSITY; OPTICAL METROLOGY; OPTICAL METROLOGY TOOLS; OPTICAL SURFACES; PHASE RETRIEVAL;

OPTICAL SYSTEMS;

EID: 84970900102     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.605914     Document Type: Conference Paper

References (4)

1. J. R. Fienup, J. C. Marron, T. J. Schulz and J. H. Seldin, "Hubble Space Telescope Characterized by Using Phase Retrieval Algorithms, " Appl. Opt., 32, 1747-1768, 1993.
2. J. R. Fienup, "Phase-Retrieval Algorithms for a Complicated Optical System, " Appl. Opt., 32, 1737-1746, 1993.
3. J. W. Goodman, Introduction to Fourier Optics, 2nd Ed., pp. 55-61, McGraw-Hill, San Francisco, l996.
4. J. R. Fienup, "Phase Retrieval for Undersampled Broadband Images, " J. Opt. Soc. Am. A, 16, 1831-1839, 1999.