Characterization and modelling of thin-film ferroelectric capacitors using c-v analysis

Integrated Ferroelectrics

Volumn 2, Issue 1-4, 1992, Pages 73-82

  Brennan, Ciaran J ^a  

^a CHARLES STARK DRAPER LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84969507520     PISSN: 10584587     EISSN: 16078489     Source Type: Journal    
DOI: 10.1080/10584589208215733     Document Type: Article

References (16)

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