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Volumn 852 LNCS, Issue , 1994, Pages 217-231

On single event upset error manifestation

Author keywords

[No Author keywords available]

Indexed keywords

RADIATION HARDENING; TRANSIENTS;

EID: 84969396452     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/3-540-58426-9_133     Document Type: Conference Paper
Times cited : (8)

References (14)
  • 3
    • 0021599336 scopus 로고
    • An Hdl simulation of the effects of single event upsets on microprocessor program flow
    • K. W. Li, J. R. Armstrong, J. G. Tront, “An Hdl simulation of the effects of single event upsets on microprocessor program flow”, IEEE Transactions on Nuclear Science, vol 31, no. 6, 1984.
    • (1984) IEEE Transactions on Nuclear Science , vol.31 , Issue.6
    • Li, K.W.1    Armstrong, J.R.2    Tront, J.G.3
  • 4
    • 84961242051 scopus 로고
    • A study of the error behavior of a 32-bit RISC subjected to simulated transient fault injection
    • M. Rimen, J. Ohlsson, “A study of the error behavior of a 32-bit RISC subjected to simulated transient fault injection”, Proc. International Test Confenrence, 1992.
    • (1992) Proc. International Test Confenrence
    • Rimen, M.1    Ohlsson, J.2
  • 13
    • 85027064654 scopus 로고
    • On Single Event Phenomena in Microprocerssors
    • Chalmers University of Technology, Göteborg, Sweden
    • R. Johansson, “On Single Event Phenomena in Microprocerssors”, Technical Report No. 162L, Dept. of Computer Engineering, Chalmers University of Technology, Göteborg, Sweden, 1993.
    • (1993) Technical Report No. 162L, Dept. of Computer Engineering
    • Johansson, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.