New scanning tunneling microscopy tip for measuring surface topography

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 8, Issue 1, 1990, Pages 429-433

  Akama, Y ^a   Nishimura, E ^a   Sakai, A ^a   Murakami, H ^b  

^a TOSHIBA CORPORATION   (Japan)

^b ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84967850150     PISSN: 07342101     EISSN: 15208559     Source Type: Journal    
DOI: 10.1116/1.576413     Document Type: Article

References (3)

1. S. Okayama et al., J. Vac. Sci. Technol. A 6, 440 (1988).
2. A. N. Broers, W. W. Molzen, J. J. Cuomo, and N. P. Wittle, Appl. Phys. Lett. 29, 596(1976).
3. T. Ichihashi and S. Matsui, J. Vac. Sci. Technol. B 6, 1869 (1988).