The Development of a Rasch-Type Loneliness Scale

Applied Psychological Measurement

Volumn 9, Issue 3, 1985, Pages 289-299

  de Jong Gierveld, Jenny ^a   Kamphuls, Frans ^a  

^a VU UNIVERSITY AMSTERDAM   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84965488816     PISSN: 01466216     EISSN: 15523497     Source Type: Journal    
DOI: 10.1177/014662168500900307     Document Type: Article

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