Reliable CPS Design for Mitigating Semiconductor and Battery Aging in Electric Vehicles

Proceedings - 3rd IEEE International Conference on Cyber-Physical Systems, Networks, and Applications, CPSNA 2015

Volumn , Issue , 2015, Pages 37-42

  Chang, Wanli ^a   Proebstl, Alma ^b   Goswami, Dip ^c   Zamani, Majid ^b   Chakraborty, Samarjit ^b  

^a TUM CREATE   (Singapore)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^c EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

battery aging; cyber physical systems; quality of control; Semiconductor aging

Indexed keywords

ALGORITHMS; BATTERY MANAGEMENT SYSTEMS; CONTROLLERS; DESIGN; ELECTRIC BATTERIES; ELECTRIC MACHINE CONTROL; ELECTRIC VEHICLES; INTEGRATED CIRCUIT DESIGN; QUALITY CONTROL; SECONDARY BATTERIES; VEHICLES;

ALGORITHM DEVELOPMENT; BATTERY AGING; CONTROLLER DESIGNS; CYBER PHYSICAL SYSTEMS (CPSS); CYBER-PHYSICAL SYSTEMS (CPS); ELECTRIC VEHICLES (EVS); QUALITY OF CONTROLS; SAFETY CRITICAL APPLICATIONS;

EMBEDDED SYSTEMS;

EID: 84964969283     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CPSNA.2015.16     Document Type: Conference Paper

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