Wear life prediction of contact recording head

Digest of the Asia-Pacific Magnetic Recording Conference 2002, APMRC 2002

Volumn , Issue , 2002, Pages

  Kawakubo, Y ^a   Kobatake, S ^a   Nagata, K ^a   Miyazawa, S ^a  

^a SHINSHU UNIVERSITY   (Japan)

Author keywords

contact recording; hard disk drives; head wear life prediction; transparent pin wear test

Indexed keywords

FORECASTING; MAGNETIC RECORDING;

CONTACT RECORDING; FRACTIONAL POWER; HARD DISK DRIVE; HEAD WEAR; HEAD-DISK CONTACT; MATERIAL PARAMETER; SLIDING DISTANCES; WEAR TEST;

HARD DISK STORAGE;

EID: 84964460661     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/APMRC.2002.1037644     Document Type: Conference Paper

References (5)

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3. K. Matsuoka, D. Forrest, M.-K. Tse, E. Rabinowicz, "Accelarated Mn-Zn ferrite wear test using size effects of abrasives", JSME Trans., Ser. C, vol. 60, pp.2609-2614, 1994 (in Japanese).
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5. Y. Kawakubo, M. Ishii, Y. Kokaku, Y. Yahisa, T. Yamamoto, "Carbon overcoated pin wear tests on thin-film magnetic disks", Proc. ITC Yokohama 1995, pp. 1805-1810, 1996.