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Volumn 33, Issue , 2009, Pages 146-150
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A simulation study of Tsinghua Thomson scattering X-ray source
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Author keywords
brightness; Thomson scattering; ultra fast; X ray
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Indexed keywords
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EID: 84964285142
PISSN: 16741137
EISSN: None
Source Type: Journal
DOI: 10.1088/1674-1137/33/S2/038 Document Type: Article |
Times cited : (10)
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References (29)
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