Quantitative analysis of atomic disorders in full-Heusler [formula omitted] alloy thin films using x-ray diffraction with [formula omitted] and [formula omitted] sources

Journal of Applied Physics

Volumn 107, Issue 9, 2010, Pages 2024-

  Takamura, Yota ^a,c   Nakane, Ryosho ^a,b,c   Sugahara, Satoshi ^a,c  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84964208157     PISSN: 00218979     EISSN: 10897550     Source Type: Journal    
DOI: 10.1063/1.3350914     Document Type: Article

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