Test Reliability at the Individual Level

Structural Equation Modeling

Volumn 23, Issue 4, 2016, Pages 532-543

  Hu, Yueqin ^a   Nesselroade, John R ^b   Erbacher, Monica K ^c   Boker, Steven M ^b   Burt, S Alexandra ^d   Keel, Pamela K ^e   Neale, Michael C ^f   Sisk, Cheryl L ^d   Klump, Kelly ^d  

^a TEXAS STATE UNIVERSITY   (United States)

^b UNIVERSITY OF VIRGINIA   (United States)

^c JAMES MADISON UNIVERSITY   (United States)

^d MICHIGAN STATE UNIVERSITY   (United States)

^e FLORIDA STATE UNIVERSITY   (United States)

^f VIRGINIA COMMONWEALTH UNIVERSITY   (United States)

Author keywords

individual reliability; PANAS; parallel tests; SEM

Indexed keywords

RELIABILITY; SCANNING ELECTRON MICROSCOPY;

EMPIRICAL STUDIES; PANAS; PARALLEL TEST; PSYCHOMETRIC PROPERTIES; RELIABILITY ESTIMATES; REPEATED MEASURES; SIMULATION STUDIES; STRUCTURAL EQUATION MODELING;

TESTING;

EID: 84964018987     PISSN: 10705511     EISSN: 15328007     Source Type: Journal    
DOI: 10.1080/10705511.2016.1148605     Document Type: Article

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