-
1
-
-
67649227738
-
Thruster Options for Microspacecraft: A Review and Evaluation of Existing Hardware and Emerging Technologies
-
AIAA Paper 97-3058, July 6-9, Seattle, WA
-
Mueller, J., “Thruster Options for Microspacecraft: A Review and Evaluation of Existing Hardware and Emerging Technologies”, AIAA Paper 97-3058, 33rd Joint Propulsion Conference, July 6-9, 1997, Seattle, WA.
-
(1997)
33Rd Joint Propulsion Conference
-
-
Mueller, J.1
-
2
-
-
8744240973
-
-
IAF Paper 95-U.2.06, Oslo, Norway, Oct
-
Collins, D., Kukkonen, C., and Venneri, S., “Miniature, Low-Cost Highly Autonomous Spacecraft – A Focus for the New Millennium”, IAF Paper 95-U.2.06, Oslo, Norway, Oct. 1995.
-
(1995)
Miniature, Low-Cost Highly Autonomous Spacecraft – a Focus for the New Millennium
-
-
Collins, D.1
Kukkonen, C.2
Venneri, S.3
-
3
-
-
79953302958
-
-
AIAA 98-3331, 34th Joint Propulsion Conference, Cleveland, OH, July 13-15
-
Blandino, J., Cassady, R., and Sankovic, J., “Propulsion Requirements and Options for the New Millennium Interferometer (DS-3) Mission”, AIAA 98-3331, 34th Joint Propulsion Conference, Cleveland, OH, July 13-15, 1998.
-
(1998)
Propulsion Requirements and Options for the New Millennium Interferometer (DS-3) Mission
-
-
Blandino, J.1
Cassady, R.2
Sankovic, J.3
-
4
-
-
84963824400
-
Microfabricated Accelerator Grid System Feasibility Assessment for Micro-Ion Engines
-
IEPC Paper 97-071, Cleveland, OH, Aug
-
Mueller, J., Tang, W., Li, W., and Wallace, A., “Microfabricated Accelerator Grid System Feasibility Assessment for Micro-Ion Engines”, IEPC Paper 97-071, 25th International Electric Propulsion Conference, Cleveland, OH, Aug. 1997.
-
(1997)
25Th International Electric Propulsion Conference
-
-
Mueller, J.1
Tang, W.2
Li, W.3
Wallace, A.4
-
5
-
-
84963863947
-
Field Emissions Array Cathodes for Electric Propulsion Systems
-
AIAA Paper 98-3484, Cleveland, OH, July 13-15
-
Marrese, C., Polk, J., Jensen, K., and Gallimore, A., “Field Emissions Array Cathodes for Electric Propulsion Systems”, AIAA Paper 98-3484, 34th Joint Propulsion Conference, Cleveland, OH, July 13-15, 1998.
-
(1998)
34Th Joint Propulsion Conference
-
-
Marrese, C.1
Polk, J.2
Jensen, K.3
Gallimore, A.4
-
6
-
-
84963815356
-
The Micro-Isolation Valve: Introduction of Concept and Preliminary Results
-
AIAA Paper 98-3811, Cleveland, OH, July 13-15
-
Mueller, J., Vargo, S., Chakraborty, I., Bame, D., Tang, W., “The Micro-Isolation Valve: Introduction of Concept and Preliminary Results”, AIAA Paper 98-3811, 34th Joint Propulsion Conference, Cleveland, OH, July 13-15, 1998.
-
(1998)
34Th Joint Propulsion Conference
-
-
Mueller, J.1
Vargo, S.2
Chakraborty, I.3
Bame, D.4
Tang, W.5
-
7
-
-
84964497088
-
Carbon-Carbon Ion Engine Grids with Non-Circular Hole Apertures
-
AIAA Paper 95-2662, San Diego, CA, July 10-12
-
Brophy, J., Mueller, J., Brown, D.K., “Carbon-Carbon Ion Engine Grids with Non-Circular Hole Apertures”, AIAA Paper 95-2662, 31st Joint Propulsion Conference, San Diego, CA, July 10-12, 1995.
-
(1995)
31St Joint Propulsion Conference
-
-
Brophy, J.1
Mueller, J.2
Brown, D.K.3
-
9
-
-
0001368234
-
Dielectric Breakdown in Silicon Dioxide Films on Silicon, Part I
-
May
-
Osburn, C.M. and Ormond, D.W., “Dielectric Breakdown in Silicon Dioxide Films on Silicon, Part I”, J.Electrochem.Soc., Vol.119, No.5, pp.591-597, May 1972.
-
(1972)
J.Electrochem.Soc
, vol.119
, Issue.5
, pp. 591-597
-
-
Osburn, C.M.1
Ormond, D.W.2
-
10
-
-
0001368234
-
Dielectric Breakdown in Silicon Dioxide Films on Silicon, Part II
-
May
-
Osburn, C.M. and Ormond, D.W., “Dielectric Breakdown in Silicon Dioxide Films on Silicon, Part II”, J.Electrochem.Soc., Vol.119, No.5, pp. 597-603, May 1972.
-
(1972)
J.Electrochem.Soc
, vol.119
, Issue.5
, pp. 597-603
-
-
Osburn, C.M.1
Ormond, D.W.2
-
11
-
-
0003432842
-
Electrical Conduction and Dielectric Breakdown in Silicon Dioxide Films on Silicon
-
May
-
Osburn, C.M. and Weitzman, E.J., “Electrical Conduction and Dielectric Breakdown in Silicon Dioxide Films on Silicon”, J.Electrochem.Soc., Vol.119, No.5, pp. 603-609, May 1972.
-
(1972)
J.Electrochem.Soc
, vol.119
, Issue.5
, pp. 603-609
-
-
Osburn, C.M.1
Weitzman, E.J.2
-
12
-
-
0001635735
-
The Mechanism of Self-Healing Electrical Breakdown in MOS Structures
-
Nov
-
Klein, N., “The Mechanism of Self-Healing Electrical Breakdown in MOS Structures”, IEEE Transactions on Electron Devices, Vol. ED-13, No.11, pp. 788-805, Nov. 1966.
-
(1966)
IEEE Transactions on Electron Devices
, vol.ED-13
, Issue.11
, pp. 788-805
-
-
Klein, N.1
-
13
-
-
84975413992
-
Effects of Material and Processing Parameters on the Dielectric Strength of Thermally Grown SiO2 Films
-
Oct
-
Chou, N.J. and Eldridge, J.M., “Effects of Material and Processing Parameters on the Dielectric Strength of Thermally Grown SiO2 Films”, J.Electrochem.Soc., Vol.117, No.10, pp.1287-1293, Oct. 1970.
-
(1970)
J.Electrochem.Soc
, vol.117
, Issue.10
, pp. 1287-1293
-
-
Chou, N.J.1
Eldridge, J.M.2
-
15
-
-
0346840916
-
Der dielektrische Durchschlag in SiO2-Schichten auf Silizium
-
Fritzsche, C., “Der dielektrische Durchschlag in SiO2-Schichten auf Silizium”, Zangew. Phys., Vol.24, No.l, pp.48-52, 1967.
-
(1967)
Zangew. Phys
, vol.24
, Issue.1
, pp. 48-52
-
-
Fritzsche, C.1
-
16
-
-
84975363073
-
D-C Dielectric Breakdown of Amorphous Silicon Dioxide Films at Room Temperature
-
Jan
-
Worthing, F.L., “D-C Dielectric Breakdown of Amorphous Silicon Dioxide Films at Room Temperature”, J.Electrochem.Soc., Vol.115, No.1, pp. 88-92, Jan. 1968.
-
(1968)
J.Electrochem.Soc
, vol.115
, Issue.1
, pp. 88-92
-
-
Worthing, F.L.1
-
17
-
-
84963801997
-
Scanning Electron Micrographs of Self-Quenched Breakdown Regions in Al-SiO,-(100) Si Structures
-
Aug
-
Yang, D.Y., Johnson, W.C., and Lampert, M.A., “Scanning Electron Micrographs of Self-Quenched Breakdown Regions in Al-SiO,-(100) Si Structures”, Appl. Phys. Lett, Vol.25, No.3, Aug 1974.
-
(1974)
Appl. Phys. Lett
, vol.25
, Issue.3
-
-
Yang, D.Y.1
Johnson, W.C.2
Lampert, M.A.3
-
18
-
-
0014619145
-
Thin-Film Dielectric Properties of RF Sputtered Oxides
-
Dec
-
Pratt, I.H., “Thin-Film Dielectric Properties of RF Sputtered Oxides”, Solid State Technology, pp. 49-57, Dec. 1969.
-
(1969)
Solid State Technology
, pp. 49-57
-
-
Pratt, I.H.1
-
19
-
-
0001370175
-
The Maximum Dielectric Strength of Thin Silicon Oxide Films
-
Feb
-
Klein, N. and Gafni, H., “The Maximum Dielectric Strength of Thin Silicon Oxide Films”, IEEE Transactions on Electron Devices, Vol. ED-13, No.12, Feb. 1966.
-
(1966)
IEEE Transactions on Electron Devices
, vol.ED-13
, Issue.12
-
-
Klein, N.1
Gafni, H.2
|