Effect of thickness and crystallization on the optical energy gap of some chalcogenide phase-change thin films

2002 International Symposium on Optical Memory and Optical Data Storage Topical Meeting, ISOM/ODS 2002 - Joint International Symposium on Optical Memory and Optical Data Storage 2002, Technical Digest

Volumn , Issue , 2002, Pages 99-101

  Yao, H B ^a   Shi, L P ^a   Chong, T C ^a   Meng, H ^a   Tan, P K ^a   Miao, X S ^a  

^a DATA STORAGE INSTITUTE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CHALCOGENIDES; DATA STORAGE EQUIPMENT; DIGITAL STORAGE; ELECTROMAGNETIC WAVE ABSORPTION; ENERGY GAP; LIGHT ABSORPTION; OPTICAL CONSTANTS; RANDOM ACCESS STORAGE; REFRACTIVE INDEX; STORAGE (MATERIALS); THIN FILMS;

ABSORPTION CO-EFFICIENT; CHALCOGENIDE THIN FILMS; EXTINCTION COEFFICIENTS; OPTICAL ABSORPTION EDGE; OPTICAL APPLICATIONS; PHASE CHANGE THIN FILMS; SEMICONDUCTOR COMPOUNDS; TECHNOLOGICAL APPLICATIONS;

OPTICAL DATA STORAGE;

EID: 84962873403     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/OMODS.2002.1028580     Document Type: Conference Paper

References (5)

1. J. Tauc, in J. Tauc (ed.), Amorphous and Liquid Semiconductors, Plenum, New York, 1974, Chapter 4.
2. J. Tauc, in Optical Properties of Amorphous Semiconductors.
3. N.F. Mott, E.A. Davis, Electronic Processes in Non-crystalline Materials (Clarendon Press, Oxford 1979).
4. M. Digiulio, D. Manno, R.Rella, P. Sciliano and A. Tepore, Sol. Energy Mater., 15 (1987) 209.
5. L.P. Shi, T.C. Chong, P.K. Tan, X.S. Miao, Y.M. Huang and R. Zhao, Jpn. J. Appl. Phys., 38 (1999) 1645.