Structural specification-based testing with ADL

Proceedings of the 1996 ACM SIGSOFT International Symposium on Software Testing and Analysis, ISSTA 1996

Volumn , Issue , 1996, Pages 62-70

  Chang, Juei ^a   Richardson, Debra J ^a   Sankar, Sriram ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b SUN MICROSYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BLACK-BOX TESTING; FORMAL SPECIFICATION; SPECIFICATIONS; TESTING;

BRANCH COVERAGE; PREDICATE LOGIC; PROGRAM UNITS; SPECIFICATION BASED TESTING; STATEMENT COVERAGE; TEST CONDITION; TEST SELECTION; TESTING PROGRAMS;

SOFTWARE TESTING;

EID: 84962535562     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/229000.226302     Document Type: Conference Paper

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