Separation of the Nonlinear Source Pull from the Nonlinear System Behaviour

57th ARFTG Conference Digest Spring 2001: Best Practices and Strategies for RF Test, ARFTG Spring 2001

Volumn , Issue , 2001, Pages

  Crama, Ph ^a   Rolain, Y ^a   Van Moer, W ^a   Schoukens, J ^a  

^a VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

Author keywords

nonlinear distortions; nonlinear source pull

Indexed keywords

NONLINEAR DISTORTION; NONLINEAR SYSTEMS;

HARMONIC FREQUENCY; IQ MODULATION; MEASUREMENT DATA; MEASUREMENT TECHNIQUES; NONLINEAR BEHAVIOURS; NONLINEAR SOURCE; PHASE RELATION; TWO-TONE SIGNALS;

SOURCE SEPARATION;

EID: 84962467916     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.2001.327462     Document Type: Conference Paper

References (5)

1. Calibrated Vectorial Nonlinear-Network Analysers, T. Van den Broeck, J. Verspecht, Microwave Symposium Digest of IEEE 1994 MTT-S International, San Diego, May 23-27, 1994, pp. 1069-1072
2. VIOMAP, the S-Parameters Equivalent for Weakly Nonlinear RF and Microwave Devices, F. Verbeyst, M. Vanden Bossche, Transactions on Microwave Theory and techniques, Vol. 42, Dec. 1994, pp. 2351-2535
3. Complete 3-Port Measurement of Microwave Mixers Usinga Nonlinear Vectorial Network Analyser, Yves Rolain, Philip Vael, Wendy Van Moer, Alain Barel, Proceedings of the IEEE MTT-S International Microwave Symposium, Baltimore, Maryland, June 7-12, 1998, Vol. 3, pp. 1491-1494
4. Calibration of a Wideband IF Nonlinear Vectorial Network Analyser, Wendy Van Moer, Yves Rolain, 53rd ARFTG Conference Digest, Anaheim, California (USA), June 18, 1999, pp. 98-103
5. An Automatic Harmonic Selection Scheme for Measurements and Calibration with the Nonlinear Vectorial Network Analyser, Wendy Van Moer, Yves Rolain, Johan Schoukens, IEEE MTT International Microwave Symposium Digest Volume III, Boston, Massachusetts, June 11-16, 2000, pp. 1855-1858