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Volumn 2, Issue , 2000, Pages 231-240
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Model-based troubleshooting for information survivability
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Author keywords
[No Author keywords available]
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Indexed keywords
MODEL-BASED OPC;
SELF DIAGNOSIS;
STATISTICAL MODELING;
ARTIFICIAL INTELLIGENCE;
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EID: 84962306768
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/DISCEX.2000.821523 Document Type: Conference Paper |
Times cited : (1)
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References (4)
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