Steganography via codes for memory with defective cells

43rd Annual Allerton Conference on Communication, Control and Computing 2005

Volumn 3, Issue , 2005, Pages 1521-1537

  Fridrich, Jessica ^a   Goljan, Miroslav ^a   Soukal, David ^b  

^a Department of Electrical and Computer Engineering ^*  (United States)

^b State University of New York at Binghamton   (United States)

Author keywords

Embedding efficiency; LT codes; Memory with defective cells; Random linear codes; Steganography

Indexed keywords

EID: 84962115510     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)

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