Spectral Reflectance Models for Characterizing Winter Wheat Genotypes

Journal of Crop Improvement

Volumn 30, Issue 2, 2016, Pages 176-195

  Ajayi, S ^a   Reddy, S K ^b   Gowda, P H ^c   Xue, Q ^b   Rudd, J C ^b   Pradhan, G ^d   Liu, S ^b   Stewart, B A ^e   Biradar, C ^f   Jessup, K E ^b  

^a TEXAS A AND M UNIVERSITY   (United States)

^b TEXAS A AND M UNIVERSITY   (United States)

^c USDA ARS GRAZINGLANDS RESEARCH LABORATORY   (United States)

^d Williston Research Extension Center   (United States)

^e WEST TEXAS A AND M UNIVERSITY   (United States)

^f International Center for Agricultural Research in Dry Areas   (Jordan)

Author keywords

Leaf area index; phenotyping; spectral reflectance; spectroradiometer; vegetation indices; yield

Indexed keywords

EID: 84962106213     PISSN: 15427528     EISSN: 15427536     Source Type: Journal    
DOI: 10.1080/15427528.2016.1138421     Document Type: Article

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