Functional-based ATPG for path delay faults

2000 Southwest Symposium on Mixed-Signal Design, SSMSD 2000

Volumn , Issue , 2000, Pages 159-164

  Michael, M ^a   Tragoudas, S ^a  

^a Southern Illinois University Carbondale   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MIXED SIGNAL INTEGRATED CIRCUITS;

BENCHMARK CIRCUIT; DELAY FAULT TEST; DELAY FAULT TESTABILITY; NOVEL METHODOLOGY; PATH DELAY FAULT; TIME FRAME;

DELAY CIRCUITS;

EID: 84961992326     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SSMSD.2000.836465     Document Type: Conference Paper

References (18)

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