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Volumn , Issue , 2005, Pages

Measuring precision for static and dynamic design pattern recognition as a function of coverage

Author keywords

[No Author keywords available]

Indexed keywords

PATTERN RECOGNITION; STATIC ANALYSIS;

EID: 84961567253     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1083246.1083253     Document Type: Conference Paper
Times cited : (16)

References (21)
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    • Simple and efficient relational querying of software structures
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  • 5
    • 0026913667 scopus 로고
    • Symbolic Boolean manipulation with ordered binary-decision diagrams
    • R. E. Bryant. Symbolic Boolean manipulation with ordered binary-decision diagrams. ACM Computing Surveys, 24(3):293-318, 1992.
    • (1992) ACM Computing Surveys , vol.24 , Issue.3 , pp. 293-318
    • Bryant, R.E.1
  • 9
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    • 85027414876 scopus 로고    scopus 로고
    • February
    • Javassist. Javassist. Internet, February 2005. http://www.csg.is.titech.ac.jp/-chiba/javassist/.
    • (2005) Javassist. Javassist. Internet
  • 11
    • 0032667110 scopus 로고    scopus 로고
    • Pattern-based reverse-engineering of design components
    • IEEE Computer Society Press, Los Angeles, USA, May
    • R. K. Keller, R. Schauer, S. Robitaille, and P. Page. Pattern-based reverse-engineering of design components. In International Conference of Software Engineering, IEEE Computer Society Press, pages 226-235, Los Angeles, USA, May 1999.
    • (1999) International Conference of Software Engineering , pp. 226-235
    • Keller, R.K.1    Schauer, R.2    Robitaille, S.3    Page, P.4
  • 12
    • 0030378133 scopus 로고    scopus 로고
    • Design recovery by automated search for structural design patterns in object-oriented software
    • November
    • C. Krämer and L. Prechelt. Design recovery by automated search for structural design patterns in object-oriented software. In Working Conference on Reverse Engineering, pages 208-215, November 1996.
    • (1996) Working Conference on Reverse Engineering , pp. 208-215
    • Krämer, C.1    Prechelt, L.2
  • 16
    • 85027413087 scopus 로고    scopus 로고
    • Sun microsystems. Internet, December
    • Sun microsystems. J2SE API Specification. Internet, December 2004. http://java.sun.com.
    • (2004) J2SE API Specification
  • 17
    • 84857484657 scopus 로고    scopus 로고
    • Sun Microsystems. Internet, February
    • Sun Microsystems. Java debug interface. Internet, February 2005. http://java.sun.com/j2se/1.4.2/docs/guide/jpda/jdi/.
    • (2005) Java Debug Interface
  • 18
    • 84858522027 scopus 로고    scopus 로고
    • Sun Microsystems. Internet, February
    • Sun Microsystems. Java platform debugger architecture. Internet, February 2005. http://java.sun.com/products/jpda/index.jsp.
    • (2005) Java Platform Debugger Architecture
  • 19
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    • Improving design pattern instance recognition by dynamic analysis
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    • L. Wendehals. Improving design pattern instance recognition by dynamic analysis. In ICSE 2003 Workshop on Dynamic Analysis (WODA), Portland, USA, May 2003.
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    • Selective tracing of Java programs
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.