Diagnostic Fault Simulation of Sequential Circuits

Proceedings - International Test Conference

Volumn 1992-January, Issue , 1992, Pages 178-186

  Rudnick, E M ^a   Fuchs, W K ^a   Patel, J H ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

Benchmark testing; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Electrical fault detection; Fault diagnosis; Power measurement; Sequential analysis; Sequential circuits

Indexed keywords

CIRCUIT SIMULATION; ELECTRIC FAULT LOCATION; ELECTRIC NETWORK ANALYSIS; ELECTRIC POWER MEASUREMENT; FAILURE ANALYSIS; RECONFIGURABLE HARDWARE; SEQUENTIAL CIRCUITS;

BENCHMARK TESTING; CIRCUIT FAULTS; CIRCUIT TESTING; COMPUTATIONAL MODEL; ELECTRICAL FAULT DETECTIONS; SEQUENTIAL ANALYSIS;

FAULT DETECTION;

EID: 84961246518     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.1992.527818     Document Type: Conference Paper

References (0)