Test sequences generation from LUSTRE descriptions: GATEL

Proceedings ASE 2000: 15th IEEE International Conference on Automated Software Engineering

Volumn , Issue , 2000, Pages 229-237

  Marre, B ^a   Arnould, A ^b  

^a UFR 919 Laboratoire d'Informatique Pour la Mécanique et les Sciences de l'Ingénieur   (France)

^b UNIVERSITÉ DE POITIERS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATION; BLACK-BOX TESTING; COMPUTATIONAL LINGUISTICS; COMPUTER PROGRAMMING LANGUAGES; ELECTRIC POWER SYSTEM CONTROL; INTEGRATION TESTING; LOGIC PROGRAMMING; RECONFIGURABLE HARDWARE; SOFTWARE ENGINEERING; SOFTWARE TESTING;

CONSTRAINT LOGIC PROGRAMMING; CRITICAL APPLICATIONS; ELECTRICAL POWER PRODUCTION; INDUSTRIAL CASE STUDY; INTERVAL CONSTRAINT; SYNCHRONOUS DATA FLOW; TEST SEQUENCE GENERATIONS; TEST SEQUENCES GENERATION;

TESTING;

EID: 84960915058     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ASE.2000.873667     Document Type: Conference Paper

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